By W. Richard Bowen
This is the 1st publication to assemble either the fundamental idea and confirmed procedure engineering perform of AFM. it's awarded in a fashion that's obtainable and worthwhile to training engineers in addition to to those that are enhancing their AFM abilities and information, and to researchers who're constructing new items and suggestions utilizing AFM.
The ebook takes a rigorous and functional procedure that guarantees it truly is without delay acceptable to procedure engineering difficulties. basics and strategies are concisely defined, whereas particular advantages for method engineering are essentially outlined and illustrated. Key content material contains: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the advance of fouling resistant membranes; nanoscale pharmaceutical research; nanoengineering for mobile sensing; polymers on surfaces; micro and nanoscale rheometry.
- Atomic strength microscopy (AFM) is a crucial instrument for method engineers and scientists because it allows greater strategies and products
- The merely ebook facing the speculation and sensible functions of atomic strength microscopy in strategy engineering
- Provides best-practice tips and adventure on utilizing AFM for procedure and product improvement
Read or Download Atomic Force Microscopy in Process Engineering. Introduction to AFM for Improved Processes and Products PDF
Similar instruments & measurement books
This ebook covers cutting-edge options time-honored in sleek fabrics characterization. very important facets of characterization, fabrics constructions and chemical research, are incorporated. everyday concepts, similar to metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are defined.
Do you frequently lose your keys? you can find during this e-book the simplest technique to locate them, or a minimum of the single deduced from statistical physics. what's the hyperlink with biology? a few proteins use a similar technique to locate their objective within a dwelling phone. this instance illustrates one of many many hyperlinks among physics and biology.
The examine of time, astronomy, and calendars, has been heavily intertwined within the background of Western tradition and, extra fairly, Jewish culture. Jewish curiosity in astronomy was once fostered via the Jewish calendar, which used to be in line with the classes of the solar and the moon, when astronomy, in flip, ended in a greater knowing of the way time may be reckoned.
- Viscometry for Liquids: Calibration of Viscometers
- Grating spectroscopes and how to use them
- Imaging and Electron Physics
- Conversion Tables of Units in Science & Engineering
- How To Show Things With Words: A Study On Logic Language And Literature
- Medizinische Bildverarbeitung: Bildanalyse, Mustererkennung und Visualisierung fur die computergestutzte arztliche Diagnostik und Therapie
Extra info for Atomic Force Microscopy in Process Engineering. Introduction to AFM for Improved Processes and Products
Technol. 39 (2005) 3592–3600.  G. A. Prestidge, Colloid probe AFM investigation of the influence of crosslinking on the interaction behaviour and nano-rheology of colloidal droplets, Langmuir 21 (2005) 12342–12347.  M. Reitsma, V. Craig, S. Biggs, Elasto-plastic and visco-elastic deformations of a polymer sphere measured using colloid probe and scanning electron microscopy, Int. J. Adhesion Adhesives 20 (2000) 445–448. R. Castro, M. S. Petri, Adhesion forces between hybrid colloidal particles and concavilin A, Langmuir 22 (2006) 3757–3762.
Shi, P. Dumania, P. W. Rangelow, Fabrication of multipurpose AFM/SCM/SEP microprobe with integrated piezoresistive deflection sensor and isolated conductive tip, Microelectron. Eng. 41/42 (1998) 477–480. -F. Indermuhle, G. -A. F. De Rooij, Fabrication and characterization of cantilevers with integrated sharp tips and piezoelectric elements for actuation and detection for parallel applications, Sensors Actuat. A 60 (1997) 186–190.  T. Itoh, T. Suga, Self-excited force-sensing microcantilevers with piezoelectric thin films for dynamic scanning force microscopy, Sensors Actuat.
The cantilever plus glue is then allowed to come into contact with the particle, removing it from the surface of the slide. The glue is allowed to set and the probe is then ready for use. An alternative method also used is to place a drop of glue on the end of the cantilever using a fine wire. Another wire is then used to pick up a particle using capillary adhesion and then place it on the glued end of the lever . 2 Illustration of a typical micromanipulator set-up. It consists of a movable stage (a) mounted below an optical microscope (b).